JEOL JSM-7400F Scanning Electron Microscope / Oxford Inca / Excellent SEM, US $157,500.00 – Picture 0

JEOL JSM-7400F Scanning Electron Microscope / Oxford Inca / Excellent SEM, US $157,500.00 – Picture 1

JEOL JSM-7400F Scanning Electron Microscope / Oxford Inca / Excellent SEM, US $157,500.00 – Picture 2

JEOL JSM-7400F Scanning Electron Microscope / Oxford Inca / Excellent SEM, US $157,500.00 – Picture 3

JEOL JSM-7400F Scanning Electron Microscope / Oxford Inca / Excellent SEM, US $157,500.00 – Picture 4

JEOL JSM-7400F Scanning Electron Microscope / Oxford Inca / Excellent SEM, US $157,500.00 – Picture 5

JEOL JSM-7400F Scanning Electron Microscope / Oxford Inca / Excellent SEM, US $157,500.00 – Picture 6

JEOL JSM-7400F Scanning Electron Microscope / Oxford Inca / Excellent SEM, US $157,500.00 – Picture 7

JEOL JSM-7400F Scanning Electron Microscope / Oxford Inca / Excellent SEM, US $157,500.00 – Picture 8

JEOL JSM-7400F Scanning Electron Microscope / Oxford Inca / Excellent SEM, US $157,500.00 – Picture 9

JEOL JSM-7400F Scanning Electron Microscope / Oxford Inca / Excellent SEM, US $157,500.00 – Picture 10

Jeol Jsm-7400f Scanning Electron Microscope / Oxford Inca / Excellent Sem

US $157,500.00

Palisades Park, New Jersey, United States
Jan 30th

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Please contact us through ebay mail, or directly by phone: (201) 592-1864, or by email: nrscientific@gmail.com Additional photos and information available on request. JEOL JSM-7400F Scanning Electron Microscope Oxford Instruments INCA EDS/EDX Please note: The Oxford EDS system had been deinstalled at the time these photos were taken. This system was deinstalled by JEOL and the INCA EDS was deinstalled by Oxford. The system was crated and vacuum bagged under their directon. It was on a maintenance contract through deinstallation, and operation was checked at time of deinstallation. This is an extremely high quality system, and is rarely, if ever, found on the secondary market. Please contact us for additional photos, details, etc., etc. Naturally, credit cards can not be accepted for a purchase of this size. Kindly contact us regarding suitable payment arrangements. We also welcome University inquiries. For your reference, the seller is N&R Scientific Co. Our main facility is located in the metropolitan NYC area. FROM THE MANUFACTURER'S DESCRIPTION The JSM-7400F delivers 50 percent higher resolution than ever before, achievable at low kV and providing unprecedented image quality for both nanoscience and nanotechnology research. New semi in-lens technology provides a new level of imaging detail: - For image resolution of 1.5nm at 1kVe to meet the precise structural evidence and imaging needed by materials scientists working in nanoscience and semiconductory technology. - Advanced lens design includes a patented SE enhancer, r-filter, and in-lens backscatter detector to enhance image quality, reduce charging contrast and heighten Z-contrast. - SE enhancer multiplies higher-energy secondary electrons through the objective lens and enhances contrast quality of surface structures. - R-filter suppresses the effect of electron charge on nonconductive specimens. - In-lens backscattered electron detector efficiently detects backscattered electrons with 1 kV or lower energy incident electrons that are generated from the very surface of the sample. - Improved, flexible analytical geometry enables a working distance of 8 mm at a takeoff angle of 35 degrees. An EBSD detector can be used simultaneously with the EDS. Extreme versatility for extreme analytical and industrial applications. The large chamber makes it possible to analyze most samples without altering them. Simple to operate and easy-to-use.

Condition	Used : An item that has been used previously. The item may have some signs of cosmetic wear, but is fully operational and functions as intended. This item may be a floor model or store return that has been used. See the seller’s listing for full details and description of any imperfections.
Seller Notes	“Deinstalled and crated by manufacturer. Was on Maintenance Contract.”